| 引用本文: | 曾芷德,盛运焕.论四值动态代价分析方法.[J].国防科技大学学报,1988,10(1):1-7.[点击复制] |
| Zeng Zhide,Sheng Yunhuan.On the Four Values Dynamic Costs Analysis Method[J].Journal of National University of Defense Technology,1988,10(1):1-7[点击复制] |
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| 论四值动态代价分析方法 |
| 曾芷德, 盛运焕 |
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(计算机系)
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| 摘要: |
| 本文在文献[10]的基础上，着重论述了四值动态代价分析方法引进故障电路代价FC和故障可测度T的新概念的必要性。并从预报数字电路中的不可测故障、提高故障敏化效率和选取引线置值模式的效率三方面，对四值分析与文献[1]的二值分析进行了详细比较，结论是：四值分析定义的可测度比二值更接近数字电路实际，加速测试生成的效果更好。实践表明，四值分析用于自动测试生成系统 ATGS，所节省的计算机CPU时间为二值分析的3倍。 |
| 关键词: 故障电路代价，故障可测度，四值动态代价分析。 |
| DOI： |
| 投稿日期：1987-06-01 |
| 基金项目: |
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| On the Four Values Dynamic Costs Analysis Method |
| Zeng Zhide, Sheng Yunhuan |
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(Department of Computer science)
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| Abstract: |
| The paper discusses mainly the necessity that new concepts on costs Fc in fau1ty circuit and measures T of faulty testability are introduced in the four va1ues dynamic costs ana1ysis method，based on the literature [10]. And comparing the four Values analysis with the two va1ues analysis of literature [1] comes from the following three aspects: faulties that can't be detected are predicted，efficiency se1ecting patterns of faulty sensitization and assigning line Values，we come to the conclu sion that testability measures defined in the four va1ues ana1ysis are rea1isticer than the two va1ues in an aspects near real digita1 circuits and better in an effects for speeding test generation. In practice has been indicated that when the four va1ues analysis is applied to automatic test generation system ATGS，computer CPU time economized equals three times of the two va1ues. |
| Keywords: Cost in fault Circuit,Measure of fault tesability,Four values dy namic cost analysis |
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