| 引用本文: | 胡政,易晓山,温熙森.边界扫描测试信息压缩算法.[J].国防科技大学学报,2000,22(2):101-105.[点击复制] |
| HU Zheng,YI Xiaoshan,WEN Xisen.Information Compressing Algorithm in Boundary-Scan Test[J].Journal of National University of Defense Technology,2000,22(2):101-105[点击复制] |
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| 边界扫描测试信息压缩算法 |
| 胡政, 易晓山, 温熙森 |
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(国防科技大学 机电工程与自动化学院, 湖南 长沙, 410073)
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| 摘要: |
| 为了解决IEEE 1149. 1 边界扫描测试优化生成问题, 提出了一种新型的测试矩阵压缩算法。该算法首先应用被测试电路板的结构信息构造有限制的短路故障模型, 然后以有限制的短路故障模型为基础对测试矩阵进行压缩处理, 尽可能剔除测试矩阵中的无效测试信息, 从而达到测试优化生成的目的。理论分析及实验验证表明, 该算法能够获得紧凑性指标相当优化的测试矩阵, 实现较高的测试信息压缩率。 |
| 关键词: 可测试性 边界扫描 测试生成 优化 |
| DOI： |
| 投稿日期：1999-09-20 |
| 基金项目: |
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| Information Compressing Algorithm in Boundary-Scan Test |
| HU Zheng, YI Xiaoshan, WEN Xisen |
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(College of Mechatronics Engineering and Automation, National Univ. of Defense Technology, Changsha 410073, China)
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| Abstract: |
| In order to solve the problem of the test pattern optimal generation in boundary-scan test, a new algorithm, called test matrix compress algorithm, is presented. In the new algorithm, firstly, set up the limited-short-fault-Model applying the structural information of the circuit board on test; then, based on the limited-short-fault-Model, carry out compressing process on the complete test matrix to generate optimal test matrix. The main idea of this algorithm is to remove invalid or redundant information from test matrix to the greatest extent, while keeping the effective test information. Through theoretic analysis and experimental validation, it is proved that the algorithm can get good optimization result and achieve great test information compressing ratio by this algorithm. |
| Keywords: Testability Boundary-Scan Test Generation Optimization |
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