| 引用本文: | 胡政,黎琼炜,温熙森.可测试性技术中的图论问题及其求解.[J].国防科技大学学报,2000,22(6):105-108.[点击复制] |
| HU Zheng,LI Qiongwei,WEN Xisen.Two Topological Problems and Their Solutions in Testability[J].Journal of National University of Defense Technology,2000,22(6):105-108[点击复制] |
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| 可测试性技术中的图论问题及其求解 |
| 胡政, 黎琼炜, 温熙森 |
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(国防科技大学 机电工程与自动化学院, 湖南 长沙 410073)
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| 摘要: |
| 近20年来，为了解决结构日益复杂的电路测试问题，可测试性技术得到了迅速发展。在可测试性技术中，针对不同的测试对象，如何对可测试性设计方案以及测试策略进行优化，降低总体代价，是亟待解决的问题。为了解决这两类典型的优化问题，首先应用图论方法建立问题的拓扑描述模型，然后通过构造相应的逻辑求解函数，给出问题最优解的求解算法，并通过简单实例演示。 |
| 关键词: 可测试性 优化 图论 算法 |
| DOI： |
| 投稿日期：2000-06-09 |
| 基金项目:国家部委项目资助(19.6.5.2) |
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| Two Topological Problems and Their Solutions in Testability |
| HU Zheng, LI Qiongwei, WEN Xisen |
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(College of Mechatronics Engineering and Automation, National Univ. of Defense Technology, Changsha 410073, China)
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| Abstract: |
| During the last decade, in order to solve the test problem of complex electronic system, the concept of testability has been accepted by more and more researchers and engineers. Its techniques have also developed very quickly. In testability, how to optimize the design and test approach of various systems to reduce the total cost is very important. Applying topology theory, we build up the topological descriptive model of the two typical optimization problems in testability, and then develop their optimal solving algorithms respectively. |
| Keywords: testability optimization topology algorithm |
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