引用本文: | 王同权,戴宏毅,沈永平,等.宇宙高能质子致单粒子翻转率的计算.[J].国防科技大学学报,2002,24(2):11-13.[点击复制] |
WANG Tongquan,DAI Hongyi,SHEN Yongping,et al.Calculation of Cosmic High Energy Proton Induced Single Event Upset Rate[J].Journal of National University of Defense Technology,2002,24(2):11-13[点击复制] |
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宇宙高能质子致单粒子翻转率的计算 |
王同权, 戴宏毅, 沈永平, 张若棋, 肖亚斌 |
(国防科技大学 理学院,湖南 长沙 410073)
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摘要: |
通过简化半导体器件灵敏单元,计算得到了宇宙高能质子在器件灵敏单元内产生的能量沉积。然后利用地面重离子实验单粒子翻转数据得到的Weibull函数,计算了CRRES卫星轨道、33mm铝屏蔽壳体内几种器件的单粒子翻转率,并与已有结果进行了比较说明。 |
关键词: 高能质子 空间辐射 单粒子翻转 卫星 |
DOI: |
投稿日期:2001-04-24 |
基金项目:国家部委基金项目资助(98J11.2.2.KG0126) |
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Calculation of Cosmic High Energy Proton Induced Single Event Upset Rate |
WANG Tongquan, DAI Hongyi, SHEN Yongping, ZHANG Ruoqi, XIAO Yabin |
(College of Science, National Univ. of Defense Technology, Changsha 410073, China)
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Abstract: |
By simplifying the sensible volume of semiconductor devices, the energy deposited by the cosmic high-energy protons in the sensible volume of semiconductor devices is calculated. Then by using the Weibull function derived by the ground heavy ion SEU experiments, the SEU rates of several devices by the shielding of 33 mm Aluminum in the CRRRES satellite orbit are calculated. The results are compared and analyzed. |
Keywords: high energy proton space radiation SEU(single event upset) satellite |
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