The Influence of Guiding Magnetic Fieldto the E-Beam Reflux in Foil-less Diode
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    Abstract:

    The reflux is one of the main factors to cause the dielectric surface flashover. The possibility of producing the reflux is analyzed by the use of Maxwell equations and electron motion equations. Then the PIC method is used to simulate the production process of the e beam electrons reflux in foil-less diode and some simulation results are presented. Finally some suggestions are given for the optimum design of the diode by choosing proper guiding magnetic field and diode structure.

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History
  • Received:October 18,2001
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  • Adopted:
  • Online: August 21,2013
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