A Study on the Overlapped Application Scheme of ClustersTesting in Boundary Scan Testing
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    Abstract:

    Aiming at the time-consuming problem of clusters testing in boundary scan testing of circuit boards, an application scheme of clusters testing-the overlapped application scheme is proposed based on “parallel testing”. Theoretical analysis and experiments show that this scheme is the best testing application scheme and can reduce the clusters testing time greatly.

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History
  • Received:March 27,2002
  • Revised:
  • Adopted:
  • Online: August 21,2013
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