| 引用本文: | 胡君遂,黄大暾,杨志涛,等.NICALON(SiC)纤维增强铝预制丝透射电镜样品的研制.[J].国防科技大学学报,1989,11(2):107-111.[点击复制] |
| Hu Junsui,Huang Datun,Yang Zhitao,et al.Development of the Transmission Electron Microscope Sample of NICALON(SiC)/Al Preformed Wires[J].Journal of National University of Defense Technology,1989,11(2):107-111[点击复制] |
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| NICALON(SiC)纤维增强铝预制丝透射电镜样品的研制 |
| 胡君遂, 黄大暾, 杨志涛, 张家春 |
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(材料科学与应用化学系)
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| 摘要: |
| 文中研究了用离子减薄法制备NICALON(SiC)/Al 预制丝的透射电镜(TEM)样品。结果表明:用离子减薄法制备含有性质非常不同的组元(如碳化硅-铝复合材料)TEM 样品是一种方便、有效的方法。运用 TEM初步分析了所制出的预制丝样品。 |
| 关键词: 复合材料，金属基复合材料，碳化硅一铝，TEM样品，离子减薄 |
| DOI： |
| 投稿日期：1988-04-05 |
| 基金项目: |
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| Development of the Transmission Electron Microscope Sample of NICALON(SiC)/Al Preformed Wires |
| Hu Junsui, Huang Datun, Yang Zhitao, Zhang Jiachun |
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(Department of Material Science and Applied Chemistry)
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| Abstract: |
| In this paper，the preparation of the Transmission Electron Microscope (TEM) sample of NICALON (SiC)/Al preformed wires has been studied by means of Argon Ion Thinning technique. The result has shown that it is a convienient and effective method to prepare the TEM sample which contains the components with very different properties，such as the compostes of silicon carbide-aluminium. The sample of the preformed wires fabricated by the AIT method has preliminary been analyzed with the TEM. |
| Keywords: composite material,metal matrix composites,silicon carbide-aluminium,TEM sample,Ion-Thinning |
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