| 引用本文: | 温熙森,徐永成,易晓山.智能理论在BIT设计与故障诊断中的应用.[J].国防科技大学学报,1999,21(1):97-101.[点击复制] |
| Wen Xisen,Xu YongCheng,Yi Xiaoshan.The Application of Intelligent Theory to the Built-in Test Design and Fault Diagnosis[J].Journal of National University of Defense Technology,1999,21(1):97-101[点击复制] |
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| 智能理论在BIT设计与故障诊断中的应用 |
| 温熙森, 徐永成, 易晓山 |
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(国防科技大学 机电工程与仪器系 湖南 长沙 410073)
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| 摘要: |
| 近20年来机内测试(BIT)技术从理论到应用取得了显著进展, 已成为提高产品测试性和诊断能力的有效途径。本文概述了BIT技术的特点, 分析了国内外BIT的发展趋势, 对BIT智能化从系统设计、信息处理到综合决策各阶段进行概括, 对专家系统、神经网络、模糊理论、信息融合等智能理论在BIT中的应用进行了综合分析, 并初步建立智能BIT的理论框架。 |
| 关键词: 机内测试, 人工智能, 测试性, 神经网络 |
| DOI： |
| 投稿日期：1998-04-28 |
| 基金项目: |
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| The Application of Intelligent Theory to the Built-in Test Design and Fault Diagnosis |
| Wen Xisen, Xu YongCheng, Yi Xiaoshan |
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(Department of Mechantronics Engineering and Instrumentation, NUDT, Changsha, 410073)
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| Abstract: |
| During the last twenty years, the theory and application of built-in test (BIT) have made prominent progress. The BIT technology has been the effective method of improving product's testability and diagnosis ability. The paper summarizes the trait of BIT technology, analyzes its developing trends all over the world, and generalizes the intelligence of BIT during its phrases of system design, information process and synthetic decision, then synthetically analyzes the application to BIT of expert system, neural network, fuzzy theoetic, information fusion and other intelligent theories and builds up the theory frame of intelligent BIT. |
| Keywords: built-in test, artificial intelligence, testability, neural network |
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