| 引用本文: | 胡政,温熙森.边界扫描测试的数学描述模型.[J].国防科技大学学报,1999,21(5):83-87.[点击复制] |
| Hu Zheng,Wen Xisen.Mathematical Model of Boundary Scan Test[J].Journal of National University of Defense Technology,1999,21(5):83-87[点击复制] |
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| 边界扫描测试的数学描述模型 |
| 胡政, 温熙森 |
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(国防科技大学 机械电子工程与仪器系 湖南 长沙 410073)
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| 摘要: |
| IEEE 1149.1边界扫描机制是一种新型的VLSI电路测试及可测试性设计的有效方法, 为了高效地应用边界扫描机制对电路系统进行测试, 必须对其所涉及的理论方法进行深入探讨。本文应用布尔矩阵理论建立起边界扫描测试的数学描述模型, 并基于所建立的模型导出了边界扫描测试中的故障检测条件和故障隔离条件。为边界扫描测试生成算法的深入研究奠定了理论基础。 |
| 关键词: 可测试性设计, 边界扫描, 布尔矩阵, 数学模型, 测试生成 |
| DOI： |
| 投稿日期：1999-03-09 |
| 基金项目:国家部委基金资助项目 |
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| Mathematical Model of Boundary Scan Test |
| Hu Zheng, Wen Xisen |
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(Department of Mechatronics and Instrumentation, NUDT, Changsha, 410073)
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| Abstract: |
| Boundary-Scan Technique(BST) is a new and effective way of test and design-for-testability for VLSI circuits. In order to use BST more efficiently, it is necessary to study the basic theory of boundary-scan test thoroughly and precisely. In this paper, A mathematical model of boundary-scan test process is set up based on Boolean Matrix theory. Then, by applying the model established, two boundary-scan test generation principles are presented. The first one gives the sufficient condition for fault detection in boundary-scan test. The second gives the sufficient condition for fault isolation and diagnosis in boundary scan test. The mathematical model and its deduction constitute the theoretical basis of boundary scan test, which can be used in developing test generation algorithms with better property. |
| Keywords: design-for-testability, boundary scan, Boolean matrix, mathematical model, test generation |
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