| 引用本文: | 谢政,郁殿龙.测试点的选取问题.[J].国防科技大学学报,2001,23(1):93-96.[点击复制] |
| XIE Zheng,YU Dianlong.The Problem of Choosing The Testing Point[J].Journal of National University of Defense Technology,2001,23(1):93-96[点击复制] |
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| 测试点的选取问题 |
| 谢政, 郁殿龙 |
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(国防科技大学 理学院,湖南 长沙 410073)
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| 摘要: |
| 在故障检测的过程中，每个测试点检测需要的时间可能不同。本文研究了如何选取一些测试点，使得这些测试点可以检测所有故障，而所需时间最少的问题。我们将其转化成整数规划问题，并给出一个求解算法.最后给出一个实例对算法加以说明。 |
| 关键词: 检测故障 集合覆盖 整数规划 |
| DOI： |
| 投稿日期：2000-09-28 |
| 基金项目: |
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| The Problem of Choosing The Testing Point |
| XIE Zheng, YU Dianlong |
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(College of Science, National Univ. of Defense Technology, Changsha 410073, China)
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| Abstract: |
| During the course of testing the malfunctions, the time for each testing point to test the malfunction may be different. The paper studies the problem how to choose some testing points to test all the malfunction，which take the least testing time .We turn the problem into an integer programming. An arithmetic to the problem is given. Finally we give an example with the arithmetic. |
| Keywords: testing malfunction set cover linear programming |
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