| 引用本文: | 刘冠军,温熙森,易晓山.边界扫描测试中簇测试交迭置入方案研究.[J].国防科技大学学报,2002,24(5):45-48.[点击复制] |
| LIU Guanjun,WEN Xisen,YI Xiaoshan.A Study on the Overlapped Application Scheme of Clusters Testing in Boundary Scan Testing[J].Journal of National University of Defense Technology,2002,24(5):45-48[点击复制] |
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| 边界扫描测试中簇测试交迭置入方案研究 |
| 刘冠军, 温熙森, 易晓山 |
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(国防科技大学 机电工程与自动化学院，湖南 长沙 410073)
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| 摘要: |
| 针对电路板边界扫描测试中簇测试时间较长、测试效率较低问题，以并行测试思想为基础，提出了一种簇测试置入方案——交迭置入方案，并对其进行了理论分析和实验验证。结果表明，该方案是最优的簇测试置入方案，可以显著减小簇测试时间，提高簇测试效率。 |
| 关键词: 边界扫描测试 簇测试 交迭置入方案 |
| DOI： |
| 投稿日期：2002-03-27 |
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| A Study on the Overlapped Application Scheme of Clusters Testing in Boundary Scan Testing |
| LIU Guanjun, WEN Xisen, YI Xiaoshan |
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(College of Mechatronics Engineering and Automation,National Univ. of Defense Technology,Changsha 410073,China)
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| Abstract: |
| Aiming at the time-consuming problem of clusters testing in boundary scan testing of circuit boards, an application scheme of clusters testing-the overlapped application scheme is proposed based on “parallel testing”. Theoretical analysis and experiments show that this scheme is the best testing application scheme and can reduce the clusters testing time greatly. |
| Keywords: boundary scan testing clusters testing overlapped application scheme |
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