| 引用本文: | 李义府,谢宏,蔡自兴,等.模拟电路中非零交叉情况下故障最小范围的确定方法.[J].国防科技大学学报,2003,25(1):88-90.[点击复制] |
| LI Yifu,XIE Hong,CAI Zixing,et al.Method for Determining the Minimum Existent Range of Fault Elements for Non-null Intersection in Analog Circuits[J].Journal of National University of Defense Technology,2003,25(1):88-90[点击复制] |
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| 模拟电路中非零交叉情况下故障最小范围的确定方法 |
| 李义府1, 谢宏2, 蔡自兴1, 李文华3 |
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(1.中南大学信息科学与工程学院，湖南 长沙 410083;2.湖南大学电气与信息工程学院，湖南 长沙 410082;3.第一军医大学生物医学工程系，广东 广州 510515)
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| 摘要: |
| 为确定模拟电路非零交叉情况下故障元件存在范围，提出了一种K故障下诊断的新方法。它是一种确定故障元件存在的最小范围的方法，即在十分现实的K故障下，确定能代表电路所有元件并给出在K故障假设下的最优可测试元件组，使故障定位工作只局限于该组元件。通过可测试值计算和规范式不确定性组与最优可测试成分组的确定，可以诊断故障元件的范围。 |
| 关键词: 可测试值 不确定性组 故障定位 最优可测试成分 |
| DOI： |
| 投稿日期：2002-09-20 |
| 基金项目:国家自然科学基金资助项目(69974043)；湖南省自然科学基金资助项目(98JJY20062) |
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| Method for Determining the Minimum Existent Range of Fault Elements for Non-null Intersection in Analog Circuits |
| LI Yifu1, XIE Hong2, CAI Zixing1, LI Wenhua3 |
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(1.College of Information Science and Engineering, Central South University, Changsha 410083, China;2.College of Electrical and Information Engineering, Hunan University, Changsha 410082, China;3.Department of Biomedical Engineering, No.1 Army Medical University, Guangzhou 510515, China)
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| Abstract: |
| A method for determining the minimum existent range of fault elements for non-null intersection in analog circuit is presented. By assuming the quite realistic K-fault hypothesis, an optimum set of testable elements that represent all the circuit elements is determined. Therefore the work for the fault location can only operate in the elements of this group. So the method constitutes the first step in the development of whatever procedure for the fault location of analog linear circuits. |
| Keywords: testability measure ambiguity groups fault location optimum set of testable component |
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