| 引用本文: | 邱兆坤,王伟,马云,等.一种新的高分辨率ADC有效位数测试方法.[J].国防科技大学学报,2004,26(4):1-5.[点击复制] |
| QIU Zhaokun,WANG Wei,MA Yun,et al.A New Method for Testing ENOB of High-resolution ADC[J].Journal of National University of Defense Technology,2004,26(4):1-5[点击复制] |
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| 一种新的高分辨率ADC有效位数测试方法 |
| 邱兆坤, 王伟, 马云, 陈曾平 |
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(国防科技大学 电子科学与工程学院，湖南 长沙 410073)
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| 摘要: |
| 谱分析法和正弦拟合法是ADC动态特性测试的两种常用方法。但在测试信号源信噪比较低的情况下，两种方法的测试结果都存在较大的偏差。提出了一种新的ADC动态性能测试方法，该方法能较好消除信号源对测量结果的影响，使得在普通信号源下可以测试高分辨率的ADC。仿真分析证明了这一测试方法的正确性。最后给出了采用该方法对一ADC系统的实测结果。 |
| 关键词: 高分辨率 A/D转换器 有效位数 |
| DOI： |
| 投稿日期：2004-03-11 |
| 基金项目:国家863基金资助项目(2002AA731130) |
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| A New Method for Testing ENOB of High-resolution ADC |
| QIU Zhaokun, WANG Wei, MA Yun, CHEN Zengping |
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(College of Electronic Science and Engineering，National Univ. of Defense Technology, Changsha 410073, China)
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| Abstract: |
| The spectrum analysis and sine wave curve fitting are the most common methods used for ADC dynamic performance tests. But if the SNR of signal source is lower than ADC system, there will be a bigger deviation in the test result. A new method is proposed to test dynamic performance. This method can eliminate the influence of signal source, through which the dynamic performance of high-resolution ADC can be tested with a conventional signal source. The simulation proves the validity of this method. Finally, the test result of an ADC system is given. |
| Keywords: high-resolution A/D converter ENOB(effective number of bits) |
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