| 引用本文: | 周宗坤,黄水根,董业民,等.0.13 μm标准CMOS工艺的高可靠流水线模数转换器.[J].国防科技大学学报,2018,40(6):165-170.[点击复制] |
| ZHOU Zongkun,HUANG Shuigen,DONG Yemin,et al.Highly reliable pipeline analog-to-digital converter in 0.13 μm standard CMOS process[J].Journal of National University of Defense Technology,2018,40(6):165-170[点击复制] |
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| 0.13 μm标准CMOS工艺的高可靠流水线模数转换器 |
| 周宗坤1,2, 黄水根1,2, 董业民1, 林敏1 |
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(1.中国科学院 上海微系统与信息技术研究所， 上海 200050;2.中国科学院大学， 北京 100049)
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| 摘要: |
| 针对航空航天电子系统对高性能模数转换器的需求，采用0.13 μm标准互补金属氧化物半导体工艺，设计可以在极端温度和空间辐射环境中稳定可靠工作的12位分辨率、50 MS/s采样率的流水线模数转换器。通过采用无采样保持电路以及抗辐射电路和版图加固等技术，在减小功耗的同时有效地削弱总剂量辐射效应的影响。测试结果表明：在-55~125 ℃温度范围内以及150 krad(Si)的总剂量辐照条件下，得到大于64 dB的信噪比、大于73.5 dB的无杂散动态范围和最大0.22 dB的微分非线性。 |
| 关键词: 流水线模数转换器 无采样保持电路 总剂量辐射效应 版图加固技术 |
| DOI：10.11887/j.cn.201806023 |
| 投稿日期：2017-10-11 |
| 基金项目:中科院重点部署基金资助项目（KGFZD-135-16-015） |
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| Highly reliable pipeline analog-to-digital converter in 0.13 μm standard CMOS process |
| ZHOU Zongkun1,2, HUANG Shuigen1,2, DONG Yemin1, LIN Min1 |
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(1.Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China;2.University of Chinese Academy of Sciences, Beijing 100049, China)
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| Abstract: |
| For demanding of high performance analog-to-digital converter for aerospace electronic systems, a 12 bit pipelined analog-to-digital converter with speed of 50 MS/s which can work well in harsh temperature and radiation environment, was presented and implemented with 0.13 μm standard complementary metal Oxide semiconductor process. By employing the circuit without sample-and-hold amplifier, the radiation hardened circuit, and the layout technology, the impact of total ionizing dose effect was significantly alleviated while reducing the power consumption. Test results show that the design achieves a 64 dB signal to noise ratio, a 73.5 dB spurious-free dynamic range, maximum 0.22 dB differential nonlinearity within wide temperature range of -55~125 ℃ and survive a total dose of 150 krad(Si). |
| Keywords: pipeline analog-to-digital converter circuit without sample-and-hold amplifier total ionizing dose effect layout reinforcement technology |
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