| 引用本文: | 陈宗胜,李志刚.开口金属腔体对强电磁脉冲的耦合效应.[J].国防科技大学学报,2020,42(1):18-23.[点击复制] |
| CHEN Zongsheng,LI Zhigang.Coupling effects of open-ended metal enclosure induced by powerful electromagnetic pulse[J].Journal of National University of Defense Technology,2020,42(1):18-23[点击复制] |
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| 开口金属腔体对强电磁脉冲的耦合效应 |
| 陈宗胜,李志刚 |
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(国防科技大学 脉冲功率激光技术国家重点实验室, 安徽 合肥 230037)
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| 摘要: |
| 为了评价腔体开口因素对核电磁脉冲(High-amplitude ElectroMagnetic Pulse, HEMP)和高功率微波(High Power Microwave, HPM)破坏效能的影响,采用CST电磁计算软件建立强电磁脉冲的孔缝耦合模型,研究孔缝的位置、大小以及长宽比对HEMP和HPM耦合效应的影响。结果表明,孔缝的位置、大小及长宽比对HEMP的耦合效应影响较大,合理控制孔缝的位置、大小以及长宽比能在一定程度上削弱HEMP的破坏效能。对于HPM,相同条件下其耦合效应要明显强于HEMP。在孔缝达到一定尺寸后,其大小和长宽比对HPM的耦合效应影响较小,仅孔缝位置会带来较大的影响。当开口平面与HPM入射方向平行时,耦合效应最弱,但此时耦合进入腔体内的能量还是很容易达到多种电子元器件的电磁损伤阈值级别。 |
| 关键词: 强电磁脉冲 开口金属腔体 耦合效应 |
| DOI：10.11887/j.cn.202001003 |
| 投稿日期：2019-03-29 |
| 基金项目:安徽省自然科学基金资助项目(1908085MF205) |
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| Coupling effects of open-ended metal enclosure induced by powerful electromagnetic pulse |
| CHEN Zongsheng, LI Zhigang |
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(State Key Laboratory of Pulsed Power Laser Technology, National University of Defense Technology, Hefei 230037, China )
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| Abstract: |
| In order to investigate the influence of an opening in a metal cavity on the destruction efficiency of HEMP (high-amplitude electromagnetic pulse) and HPM (high power microwave), the model of electromagnetic pulse coupling into an open-ended metal enclosure was built with the help of CST software. Based on the model, the influences of the location, size and length-to-width ratio of the aperture on coupling effects of HEMP and HPM were researched. As for HEMP, the location, size and length-to-width ratio of the aperture can exert great influence on the coupling effect, so the destruction efficiency of HEMP can be weakened by reasonable controls of these factors. As for HPM, its coupling effect is obviously stronger than that of HEMP under the same conditions. After the aperture reaches a certain size, its size and length-to-width ratio have few influences on the coupling effect of HPM, and only the location of the aperture has a great influence. The coupling effect is the weakest when the plane of the opening is in parallel with the incident direction of HPM, but the energy coupled into the cavity can easily reach the electromagnetic damage level of many electronic components. |
| Keywords: powerful electromagnetic pulse open-ended metal enclosure coupling effect |
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