Aerospace High-Performance Computing Team, National University of Defense Technology | The Impact of Process Fluctuations on Single-Event Upset Characteristics of Sub-20nm FinFET SRAM

Aerospace High-Performance Computing Team, National University of Defense Technology | The Impact of Process Fluctuations on Single-Event Upset Characteristics of Sub-20nm FinFET SRAM

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Published date:2026-01-20Click:

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